Conditions of use
Privacy Statement

CRYOSCAN 2200
multifunctional scanning probe microscope
New possibilities for the study of surface morphology and local properties with subnanometer space resolution


Scanning probe microscopy in the 1,8 - 350 K temperature range

- atomic force microscopy
- scanning tunneling microscopy
- scanning resistance microscopy
- electrostatic microscopy
- magnetic force microscopy
- nano lithography
- remote control via Internet


Technical parameters

Cryogenic system
Temperature interval , K 1,8 - 350
Sample space diameter , mm 40
Helium reservoir , l 2,2 or 4,2
Nitrogen reservoir , l 2,5 or 3,5
Temperature stability in the interval 4 - 40, K* 0,04
Temperature stability in the interval 40 - 300, K 0,2
Cooling down time (to 4,2 K), min 30
Helium consumption for 4.2 K cooling down , l 1,4
Sample change time , min 5
Helium consumption at 4,2 K, l/hour <0,1
Operation time at 1.8 About 6 hours
Cryostat dimensions Diameter 200 mm, 750 mm height
Weight , kg 12

Probe microscopy

System for precise scanning: Scanner FSS-3:
scanning range up to 3 ?
step discrete 0,01 nm
scanning rate max. 30 Hz
typical thermal drift less than 0,1 nm/sec
Scanner FSS-15:
scanning range up to 15 ?
step discrete 0,03 nm
scanning rate max. 30 Hz
typical thermal drift less than 1 nm/sec
sample orientation horizontal
sample size up to 10 mm in diameter and 5 mm in height
probe -sample approach truly vertical (no lateral shift)
initial probe-sample approach - 4 mm by step motor
probe vertical displacement discrete during initial approach 30 nm

Scanning tunneling microscopy mechanical head
STM modes: constant height, constant mode, spectroscopy, nanolithography
I(U) and I(Z) dependencies in selected regions
Resolution atomic on graphite
Tunneling current 50 pA-50 nA
Bias voltage range 10 V

Atomic force microscopy head
AFM modes: constant force, constant current, friction
Resolution atomic on mica

Measurements in resonant modes Nanolithography

Magnetic force microscopy mechanical head
Interleave and lift modes for contact and resonance modes
Force sensitivity up to 10-11 N
Single magnetic domains space resolution
Cantilevers with different magnetic coatings
Simultaneous acquisition of topography and magnetic profile data

Electronic control unit
12 DAC (16 bit, 10 ?sec), 2 8-channels ADC (16 bit, 10 ?sec). DSP digital feedback. Embedded direct frequency synthesizer (0,01 Hz 10 MHz)

Software
Microscope control software (master software) and data analysis software (client software) for Windows XP.
Master software local or remote control (network, Internet).
Client software local or remote real-time data acquisition, variety of filters, mathematical functions and algorithms for data analysis and 3D imaging.
Single Master and Multiple Clients operation. Embedded chat of intercommunication.
Detailed software description is placed at www.nanoscopy.net.